TY  - JOUR
AU  - Jeffrey Jargon
AU  - Kuldip Gupta
AU  - Donald DeGroot
C2  - International Journal of Rf and Microwave Computer-Aided Engineering
DA  - 2000-09-01 00:09:00
LA  - en
M1  - 10
PB  - International Journal of Rf and Microwave Computer-Aided Engineering
PY  - 2000
TI  - Artificial Neural Network Modeling for Improved On-Wafer OSLT Calibration Standards
ER  -