TY  - JOUR
AU  - Ries, F
AU  - Miller, C
C2  - OIML Seminar
DA  - 1981-12-01 00:12:00
LA  - en
PB  - OIML Seminar
PY  - 1981
TI  - Influence of Electromagnetic Interference on Electronic DevicesBulletin
ER  -