TY  - CONF
AU  - James Randa
AU  - Susan Sweeney
AU  - Tom McKay
AU  - Dave Walker
AU  - David Greenberg
AU  - Jon Tao
AU  - Judah Mendez
AU  - G. Rezvani
AU  - John Pekarik
C2  - 66TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE, Washington, DC, USA
DA  - 2005-12-01 00:12:00
LA  - en
PB  - 66TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE, Washington, DC, USA
PY  - 2005
TI  - INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32120
ER  -