TY  - CONF
AU  - Hao Xiong
AU  - John Suehle
C2  - IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA
DA  - 2006-10-15 00:10:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA
PY  - 2006
TI  - Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics
ER  -