TY  - CONF
AU  - Qiliang Li
AU  - Sang-Mo Koo
AU  - Hao Xiong
AU  - Monica Edelstein
AU  - John Suehle
AU  - Xiaoxiao Zhu
AU  - D. Ioannou
AU  - Curt Richter
C2  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
DA  - 2007-09-30 00:09:00
LA  - en
PB  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
PY  - 2007
TI  - Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32634
ER  -