TY  - CONF
AU  - Madelaine Hernandez
AU  - Adwoa Akuffo
AU  - Colleen Hood
AU  - Jose Ortiz
AU  - Allen Hefner Jr.
C2  - Proc., Power Electronics Specialist Conference, Orlando, FL, USA
DA  - 2007-06-21 00:06:00
LA  - en
PB  - Proc., Power Electronics Specialist Conference, Orlando, FL, USA
PY  - 2007
TI  - Experimental Evaluation of SiC PiN Diode Forward Bias Degradation and Long Term Stability
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32667
ER  -