TY  - CONF
AU  - Zimmerman, Neil
AU  - Cobb, J.
C2  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
DA  - 1998-07-01 00:07:00
LA  - en
PB  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
PY  - 1998
TI  - Charge Offset and Noise in SET Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13112
ER  -