TY  - CONF
AU  - Knopp, K.
AU  - Christensen, David
AU  - Rhodes, G. Vander
AU  - Pomeroy, J.
AU  - Goldberg, B.
AU  - {Umlat}nl{umlat}, M.
C2  - Proc.,  SPIE,Testing, Packaging, Reliability, and Applications of Sem, San Jose, CA
DA  - 1999-01-28 00:01:00
LA  - en
M1  - 3626
PB  - Proc.,  SPIE,Testing, Packaging, Reliability, and Applications of Sem, San Jose, CA
PY  - 1999
TI  - Spectral Mapping of Multimode Vertical-Cavity Surface-Emitting Lasers by Near-Field Scanning Optical Microscopy
ER  -