TY - CONF AU - K. Knopp AU - David Christensen AU - G. Vander Rhodes AU - J. Pomeroy AU - B. Goldberg AU - M. {Umlat}nl{umlat} C2 - Proc., SPIE,Testing, Packaging, Reliability, and Applications of Sem, San Jose, CA DA - 1999-01-28 00:01:00 LA - en M1 - 3626 PB - Proc., SPIE,Testing, Packaging, Reliability, and Applications of Sem, San Jose, CA PY - 1999 TI - Spectral Mapping of Multimode Vertical-Cavity Surface-Emitting Lasers by Near-Field Scanning Optical Microscopy ER -