TY  - GEN
AU  - George Mulholland
AU  - Michelle Donnelly
AU  - Robert Hagwood
AU  - S Kukuck
AU  - Vincent Hackley
AU  - D Pui
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2006-08-01
LA  - en
M1  - 111 No. 4
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2006
TI  - Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis
ER  -