TY - JOUR AU - Jason Ryan AU - Richard Southwick AU - Jason Campbell AU - Kin Cheung AU - John Suehle AU - Anthony Oates C2 - IEEE Electron Device Letters DA - 2013-02-28 DO - https://doi.org/10.1109/LED.2013.2251315 LA - en PB - IEEE Electron Device Letters PY - 2013 TI - Frequency-Modulated Charge Pumping: Defect Measurements with High Gate Leakage ER -