TY  - JOUR
AU  - Jason Ryan
AU  - Jibin Zou
AU  - Jason Campbell
AU  - Richard Southwick
AU  - Kin Cheung
AU  - Anthony Oates
AU  - Rue Huang
C2  - IEEE Transactions on Electron Devices
DA  - 2015-02-13
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2015
TI  - Frequency Modulated Charge Pumping with Extremely High Gate Leakage
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=915883
ER  -