TY  - CONF
AU  - Dean Jarrett
AU  - Marlin Kraft
AU  - Isabel Castro
AU  - Brett Degler
AU  - Mark Evans
C2  - NCSL International Workshop and Symposium, Orlando, FL
DA  - 2008-08-01
LA  - en
PB  - NCSL International Workshop and Symposium, Orlando, FL
PY  - 2008
TI  - Procedures for the Traceability of High Resistance Standards Using a Teraohmmeter
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33020
ER  -