TY - CONF AU - Howard Yoon AU - David Allen AU - George Eppeldauer AU - Benjamin Tsai C2 - SPIE, San Diego, CA DA - 2009-08-21 LA - en PB - SPIE, San Diego, CA PY - 2009 TI - The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904078 ER -