TY  - JOUR
AU  - Levin, Igor
AU  - Krayzman, Victor
AU  - Woicik, Joseph
AU  - Vanderah, Terrell
AU  - M., 
AU  - Proffen, Thomas
C2  - Journal of Applied Crystallography
DA  - 2009-10-05
LA  - en
M1  - 42
PB  - Journal of Applied Crystallography
PY  - 2009
TI  - A Combined Fit of Total Scattering and Extended X-ray Absorption Fine Structure Data for Local-Structure Determination in Crystalline Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902352
ER  -