TY  - JOUR
AU  - Savelas Rabb
AU  - Michael Winchester
AU  - Lee Yu
C2  - Journal of Analytical Atomic Spectrometry
DA  - 2008-01-04
LA  - en
M1  - 23
PB  - Journal of Analytical Atomic Spectrometry
PY  - 2008
TI  - Accurate Determinations of Ge Atom Fractions in SiGe Semiconductor Chips Using High Performance ICP-OES
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=832181
ER  -