TY  - GEN
AU  - Shawn Moylan
AU  - John Slotwinski
AU  - A Cooke
AU  - Kevin Jurrens
AU  - M Donmez
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2014-10-23
DO  - https://doi.org/10.6028/jres.119.017
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2014
TI  - An Additive Manufacturing Test Artifact
ER  -