TY  - CONF
AU  - Jon Geist
AU  - Muhammad Afridi
C2  - Frontiers of Characterization and Metrology for Nanoelectronics, Albany, NY
DA  - 2009-10-05
LA  - en
PB  - Frontiers of Characterization and Metrology for Nanoelectronics, Albany, NY
PY  - 2009
TI  - Temperature-Programmed Gas-Sensing With Microhotplates: An Opportunity to Enhance Microelectronic Gas Sensor Metrology
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902948
ER  -