TY  - JOUR
AU  - Jun Shin
AU  - Jaewook Kim
AU  - Nenad Ivezic
C2  - International Journal of Computer Integrated Manufacturing
DA  - 2009-10-30
LA  - en
PB  - International Journal of Computer Integrated Manufacturing
PY  - 2009
TI  - Application Information Mapping Test: An Efficient Content-Level Semantic Equivalence Test Procedure for B2B Integration
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902747
ER  -