TY  - GEN
AU  - Nien Zhang
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2010-06-30
LA  - en
M1  - 115
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2010
TI  - Linking the Results of CIPM and RMO Key Comparisons with Linear Trends
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902845
ER  -