TY  - GEN
AU  - Nien Zhang
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-10-02 00:10:00
DO  - https://doi.org/10.6028/jres.124.026
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - The use of correlated binomial distribution in estimating error rates for firearm evidence identification
ER  -