TY  - GEN
AU  - James Randa
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1997-03-01
LA  - en
M1  - 1390
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1997
TI  - Noise Temperature Measurements on Wafer
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11089
ER  -