TY  - JOUR
AU  - Mark Strus
AU  - Ann Chiaramonti
AU  - Robert Keller
AU  - Yung Jung
AU  - Younglae Kim
C2  - Nanotechnology
DA  - 2011-05-18
LA  - en
PB  - Nanotechnology
PY  - 2011
TI  - Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907014
ER  -