TY  - JOUR
AU  - Andrew Allen
AU  - Vincent Hackley
AU  - P Jemian
AU  - Jan Ilavsky
AU  - J Raitano
AU  - S Chan
C2  - Journal of Applied Crystallography
DA  - 2008-01-16
LA  - en
M1  - 41
PB  - Journal of Applied Crystallography
PY  - 2008
TI  - In Situ Ultra-Small-Angle X-Ray Scattering Study of the Solution-Mediated Formation and Growth of Nanocrystalline Ceria
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=850995
ER  -