TY  - CONF
AU  - Jason Campbell
AU  - Kin Cheung
AU  - Liangchun Yu
AU  - John Suehle
AU  - Kuang Sheng
AU  - A Oates
C2  - 2010 IEEE VLSI Symposium on Technology, Honolulu, HI
DA  - 2010-06-01
LA  - en
PB  - 2010 IEEE VLSI Symposium on Technology, Honolulu, HI
PY  - 2010
TI  - New Methods for the Direct Extraction of Mobility and Series Resistance from a Single Ultra-Scaled Device
ER  -