TY  - CONF
AU  - Ndubuisi Orji
AU  - Ronald Dixson
AU  - Aaron Cordes
AU  - Benjamin Bunday
AU  - John Allgair
C2  - Proceedings of SPIE Volume 7042 -Instrumentation, Metrology, and Standards for Nanomanufacturing III, San Diego, CA
DA  - 2009-09-25
LA  - en
M1  - 7405
PB  - Proceedings of SPIE Volume 7042 -Instrumentation, Metrology, and Standards for Nanomanufacturing III, San Diego, CA
PY  - 2009
TI  - Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903286
ER  -