TY  - JOUR
AU  - Nicholas Ritchie
AU  - Dale Newbury
AU  - Abigail Lindstrom
C2  - Microscopy and Microanalysis
DA  - 2011-12-01
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2011
TI  - Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907003
ER  -