TY  - CONF
AU  - Jason Ryan
AU  - Lan Wei
AU  - Jason Campbell
AU  - Richard Southwick
AU  - Kin Cheung
AU  - Anthony Oates
AU  - John Suehle
AU  - Phillip Wong
C2  - Proceedings of the European Solid State Device Research Conference, Helsinki, -1
DA  - 2011-09-12
LA  - en
PB  - Proceedings of the European Solid State Device Research Conference, Helsinki, -1
PY  - 2011
TI  - Circuit-Aware Device Reliability Criteria Methodology
ER  -