TY  - JOUR
AU  - James Randa
AU  - Robert Billinger
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1999-12-01
LA  - en
M1  - 48
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1999
TI  - On-Wafer Measurements of Noise Temperature
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27649
ER  -