TY - CONF AU - Joseph Kopanski AU - Ilona Sitnitsky AU - Victor Vartanian AU - Paul McClure AU - Vladimir Mancevski C2 - AIP Conference Proceedings: 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1 DA - 2011-11-18 LA - en M1 - 1395 PB - AIP Conference Proceedings: 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1 PY - 2011 TI - Enhanced Spatial Resolution Electrical Scanning Probe Microscopy By Using Carbon Nanotube Terminated Tips ER -