TY  - ICOMM
AU  - Jan Obrzut
AU  - Jason Ferguson
AU  - MIchael Azarian
C1  - http://www.ipc.org/CommitteeDetail.aspx?Committee=D-54
C2  - IPC D-54 Embedded Devices Test Methods Subcommittee
DA  - 2012-07-09
LA  - en
M1  - IPC-TM-650
PB  - IPC D-54 Embedded Devices Test Methods Subcommittee
PY  - 2012
TI  - Power Density Rating for Embedded Resistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905275
ER  -