TY  - JOUR
AU  - Joseph Tedesco
AU  - Walter Zheng
AU  - Oleg Kirillov
AU  - Sujitra Pookpanratana
AU  - Hyuk-Jae Jang
AU  - Premsagar Kavuri
AU  - Nhan Nguyen
AU  - Curt Richter
C2  - Proceedings of the IEEE
DA  - 2011-12-07
LA  - en
PB  - Proceedings of the IEEE
PY  - 2011
TI  - Characterization and Resistive Switching Properties of Solution-Processed HfO2, HfSiO4, and ZrSiO4 Thin Films on Rigid and Flexible Substrates
ER  -