TY  - CONF
AU  - Joseph Fu
C2  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS 2009, Albany, NY
DA  - 2009-10-01
LA  - en
PB  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS 2009, Albany, NY
PY  - 2009
TI  - Correction of Hysteresis in SPM Image by a Moving Window Correlation Method
ER  -