TY  - GEN
AU  - Daniel Sawyer
AU  - Brian Parry
AU  - Christopher Blackburn
AU  - Balasubramanian Muralikrishnan
AU  - Steven Phillips
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-09-27
DO  - https://doi.org/10.6028/jres.117.013
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - A Model for Geometry-Dependent Errors in Length Artifacts
ER  -