TY - CONF AU - Ravikiran Attota AU - Haesung Park AU - Victor Vartanian AU - Ndubuisi Orji AU - Richard Allen C2 - Metrology Inspection and Process Control, San Jose, CA DA - 2013-04-30 LA - en PB - Metrology Inspection and Process Control, San Jose, CA PY - 2013 TI - TSV Reveal height and bump dimension metrology by the TSOM method UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913667 ER -