TY  - JOUR
AU  - Chukwudi Okoro
AU  - Pavel Kabos
AU  - Jan Obrzut
AU  - Klaus Hummler
AU  - Yaw Obeng
C2  - IEEE Transactions on Electron Devices
DA  - 2013-06-01
DO  - https://doi.org/10.1109/TED.2013.2257791
LA  - en
M1  - 60
PB  - IEEE Transactions on Electron Devices
PY  - 2013
TI  - Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
ER  -