TY  - JOUR
AU  - Jason Holm
AU  - Benjamin Caplins
C2  - Electronic Device Failure Analysis
DA  - 2020-03-12
DO  - https://doi.org/10.31399/asm.tb.stemsem.t56000001
LA  - en
PB  - Electronic Device Failure Analysis
PY  - 2020
TI  - Introduction to STEM-in-SEM Part 2: Imaging and Diffraction with a Programmable Pixelated Detector
ER  -