TY - CONF AU - Raghu Kacker AU - David Kuhn C2 - Proceedings of IEEE International Conference on Software Testing, Verification and Validation ICST 2017, Tokyo, -1 DA - 2016-06-10 DO - https://doi.org/10.1109/COMPSAC.2016.110 LA - en PB - Proceedings of IEEE International Conference on Software Testing, Verification and Validation ICST 2017, Tokyo, -1 PY - 2016 TI - Estimating t-way Fault Profile Evolution During Testing ER -