TY  - CONF
AU  - Raghu Kacker
AU  - David Kuhn
C2  - IEEE International Conference on Artificial Intelligence Testing, OXFORD, -1
DA  - 2020-08-25
DO  - https://doi.org/10.1109/AITEST49225.2020.00027
LA  - en
PB  - IEEE International Conference on Artificial Intelligence Testing, OXFORD, -1
PY  - 2020
TI  - Effectiveness of dataset reduction in testing machine learning algorithms
ER  -