TY - CONF AU - Raghu Kacker AU - David Kuhn AU - Jagan Chandrasekaran AU - Yu C2 - Proceedings of Eighth IEEE International Conference on Software Testing, Verification and Validation ICST 2016, Chicago, IL DA - 2016-08-04 DO - https://doi.org/10.1109/ICSTW.2016.44 LA - en PB - Proceedings of Eighth IEEE International Conference on Software Testing, Verification and Validation ICST 2016, Chicago, IL PY - 2016 TI - Evaluating the Effectiveness of BEN in Locating Different Types of Software Fault ER -