TY  - JOUR
AU  - Jason Holm
AU  - Benjamin Caplins
AU  - Jason Killgore
C2  - Ultramicroscopy
DA  - 2020-02-24
LA  - en
PB  - Ultramicroscopy
PY  - 2020
TI  - Obtaining Diffraction Patterns from Annular Dark-Field STEM-in-SEM Images: Towards a Better Understanding of Image Contrast
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927768
ER  -