TY - GEN AU - Brandon Lane AU - Ho Yeung C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD DA - 2020-09-03 DO - https://doi.org/10.6028/jres.125.027 LA - en M1 - 125 PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD PY - 2020 TI - Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): "Overhang Part X4" ER -