TY  - CONF
AU  - Joseph Kopanski
AU  - Muhammad Afridi
AU  - Chong Jiang
AU  - Michael Lorek
AU  - Timothy Kohler
AU  - Curt Richter
C2  - 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
DA  - 2013-03-25
LA  - en
PB  - 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
PY  - 2013
TI  - Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes
ER  -