TY  - GEN
AU  - Vincent Lee
AU  - Daniel Sawyer
AU  - Balasubramanian Muralikrishnan
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-05-28
DO  - https://doi.org/10.6028/jres.125.016
LA  - en
M1  - 125
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Improvised Long Test Lengths via Stitching Scale Bar Method: Interim Testing of Laser Trackers
ER  -