TY  - GEN
AU  - Enrico Lucon
AU  - Raymond Santoyo
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-05-12
DO  - https://doi.org/10.6028/jres.125.015
LA  - en
M1  - 125
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Influence of Machine Anvil Wear on Charpy Test Results
ER  -