TY  - CONF
AU  - John Sieber
C2  - Advances in X-Ray Analysis, Lombard, IL
DA  - 2020-03-17
LA  - en
M1  - 63
PB  - Advances in X-Ray Analysis, Lombard, IL
PY  - 2020
TI  - How to Use and How Not to Use Certified Reference Materials in Industrial Chemical Metrology Laboratories
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928700
ER  -