TY  - JOUR
AU  - Jan Obrzut
C2  - Measurement
DA  - 2013-05-21
DO  - https://doi.org/10.1016/j.measurement.2013.04.049
LA  - en
M1  - 46
PB  - Measurement
PY  - 2013
TI  - General Analysis of Microwave Network Scattering Parameters for Characterization of Thin Film Material
ER  -