TY  - GEN
AU  - Michael Brundage
AU  - Brian Weiss
AU  - Joan Pellegrino
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-03-02
DO  - https://doi.org/10.6028/NIST.AMS.100-30
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Summary Report: Standards Requirements Gathering Workshop for Natural Language Analysis
ER  -