TY  - GEN
AU  - Brandon Lane
AU  - Ho Yeung
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-11-19
DO  - https://doi.org/10.6028/jres.124.033
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): "Three-Dimensional Scan Strategies"
ER  -