TY  - JOUR
AU  - David Black
AU  - Ning Zhang
AU  - M Dudley
AU  - X Huang
AU  - Y Chen
C2  - Journal of Electronic Materials
DA  - 2008-09-01
LA  - en
PB  - Journal of Electronic Materials
PY  - 2008
TI  - Studies of the Distribution of Elementary Threading Screw Dislocations In 4H Silicon Carbide Wafer
ER  -