TY  - JOUR
AU  - Lawrence Friedman
AU  - Wen-Li Wu
C2  - Applied Physics Letters
DA  - 2019-07-08
DO  - https://doi.org/10.1063/1.5113489
LA  - en
M1  - 115
PB  - Applied Physics Letters
PY  - 2019
TI  - Electron Reflectometry for Measuring Nanostructures on Opaque Substrate
ER  -